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EDAX LAUNCHES NEW SILICON DRIFT DETECTOR AND SAMPLE VIEWPORT FOR ORBIS MICRO-XRF ANALYZER

EDAX Inc., a leader in micro X-ray fluorescence (XRF), has introduced new detector and sample viewport options for its Orbis micro-XRF elemental analyzer system. The new detector is a thermoelectrically cooled 50 mm2 Silicon Drift Detector (SDD) capable of high-resolution spectral acquisition at high count rates.

In applications where the detector is signal “starved”, the new SDD detector can collect the same spectral data in half the time as a standard Orbis 30 mm2 SDD detector. In applications where the standard SDD detector is signal saturated (e.g. measurements on ferrous alloys), use of the new detector also can be beneficial, since the X-ray tube current can be reduced, which can potentially extend tube life.

“We are very pleased with the performance of the 50mm2 SDD detector,” notes Bruce Scruggs, Technical Product Manager for the Orbis product line. “The new detector provides a significant advancement in data collection speed and measuring precision. This new product offering will be very useful for customers who make measurements on small fragments; coatings and deposits on thin substrates, such as ink on paper; biological samples; and trace element analysis using heavier filters to improve sensitivity.”

EDAX also has introduced a sample viewport mounted into the chamber door of the Orbis analyzer. The large, X-ray safe window allows an analyst to easily verify general sample targeting among many small samples or among multiple sample trays. Or, if the sample in question is large, the analyst can easily view the orientation of the sample on the stage or the position of the sample with respect to the surrounding sample chamber walls.

“We believe the Orbis viewport option is ideal for users who typically screen many small samples or use multiple sample trays to organize samples. The viewport allows users to quickly correlate sample video to the overall position of the sample among many other similar looking samples,” comments Bruce Scruggs. “In addition, the viewport allows analysts the ability to maintain eye contact and quickly understand the orientation of larger, high-value specimens inside the sample chamber during analysis.”

The new SDD detector is available immediately for new Orbis systems with a field upgrade kit planned for installed Orbis systems in the near future. The sample viewport also is available currently as an option on new Orbis systems and as a field upgrade on existing installations.

EDAX is the acknowledged leader in Energy Dispersive Microanalysis, Electron Backscatter Diffraction and X-ray Fluorescence instrumentation. It designs, manufactures, installs and services high-quality products and systems for leading companies in the semiconductor, metals, geological, pharmaceutical, biomaterials, and ceramics markets.

Since 1962, EDAX has used its knowledge and experience to develop ultra-sensitive silicon radiation sensors, digital electronics and specialized application software that facilitate solutions to research, development and industrial requirements.

EDAX is a unit of AMETEK Materials Analysis Division. AMETEK, Inc. is a leading global manufacturer of electronic instruments and electromechanical devices with annual sales of $3.0 billion.

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