Keithley Adds Support for Non-Volatile Memory, Very Low Frequency C-V, and Increased Parallel Testing to Semiconductor Parameter Analyzer

Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has introduced a variety of enhancements for its award-winning Model 4200-SCS Semiconductor Characterization System. The Keithley Test Environment Interactive (KTEI) V8.2 upgrade includes new non-volatile memory (NVM) test libraries and sample projects for a variety of emerging memory technologies. The upgrade also supports making very low frequency capacitance-voltage measurements, which are useful for characterizing device technologies such as polymer electronics, organic LEDs (OLEDs), and OLED-based displays. In addition, KTEI V8.2 supports Model 4200-SCS system configurations with more ultra-fast current-voltage (I-V) test modules than any competitive solution, so users can test even more devices in parallel, increasing test throughput and reducing time to market.

The new NVM test libraries included in KTEI V8.2 expand the system's capabilities for testing all types of non-volatile memory devices, including flash, phase change memory (PRAM and PC-RAM), resistive memory (RRAM or ReRAM), and magnetoresistive (MRAM) memory devices. KTEI V8.2 provides a common set of test libraries for testing the various NVM technologies while incorporating the unique measurement hardware requirements associated with each. The sample projects included for each type of NVM provide the flexibility that researchers need to set up and execute tests quickly, as well as to analyze data. The examples are designed to adapt easily to use with most emerging memory technologies.

The test libraries are designed to build on the capabilities provided in two of the newest hardware options for the Model 4200-SCS, the Model 4225-PMU Ultra-Fast I V Module, and the Model 4225-RPM Remote Amplifier/Switch Module. Together, these new modules allow precise sourcing of high speed pulses, as well as accurate measurements of the transient signals produced during testing. The Model 4225-PMU measures voltage and current simultaneously at high speeds over a wide dynamic range. The Model 4225-RPM moves the measurement circuitry of the Model 4225-PMU module closer to the DUT to minimize the effects of stray capacitance while providing additional low current measurement ranges. The Model 4225-RPM also provides fast automatic switching between the 4225-PMU and the system's capacitance-voltage (C-V) and DC source-measure units, which helps simplify the test configuration and reduces the time required to complete test sequences.

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