Workshops to Cover Non-Contact Measurement Methods

Precision measurement specialist Micro-Epsilon is to host a series of technical workshops on non-contact measurement techniques and best practices. The first of these workshops will take place on 12 May 2011 at the Holiday Inn, Reading South. According to the company, the key to successful measurement is to understand the different sensor technologies that are available and to know how best to apply these. Micro-Epsilon added that, as non-contact sensor technologies continue to improve, it can be difficult to keep on top of the latest developments in this field and how these can benefit processes or applications.

Also, as interfacing technologies have improved, it is now possible to not only use analogue signal processing for measurement, but also to use digital interfaces such as Ethernet. The workshop aims to introduce the latest developments in non-contact measurement and to enable engineers to select the most suitable sensor technology for their applications; how to optimise this technology to get the best sensor performance; how to select the appropriate interface for measurements; and to understand the benefits of using Ethernet interfacing.

The technology workshop is free of charge and is aimed at anyone who uses sensors and instrumentation for displacement, temperature or profile measurement. The event will run from 9:30 until 16:00 and will be split into presentations and hands-on demonstrations of the topics covered. A free lunch will also be provided.

The agenda for the day will include: understanding the strengths and limitations of four non-contact technologies for displacement measurement; the configuration of displacement sensors for optimum performance; a case study on the integration of laser sensors by Stable Micro Systems; Ethernet interfacing and the benefits this offers in sensor configuration and remote monitoring; the basics of infrared temperature measurement theory and how it works; understanding the effects of emissivity on temperature measurement accuracy; using thermal imaging for process control; and thermal imaging in research and development applications.

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