Tektronix MDO4000 Oscilloscope Wins Prestigious ACE Awards in Test and Measurement Systems and Boards Category

Tektronix, the world's leading manufacturer of oscilloscopes, today announced it has won the EE Times and EDN 2012 UBM Electronics ACE Awards in the Test and Measurement Systems and Boards category with its MDO4000 Mixed Domain Oscilloscope Series. The awards program honors the people and companies behind the technologies and products that are changing the world of electronics.

The winners were announced at an awards ceremony on Tuesday, March 27 at The Fairmont San Jose, during DESIGN West, a new UBM Electronics conference and expo building on ESC West.

"The EE Times and EDN ACE Awards are among the most highly valued and sought after recognitions in the electronics industry, so winning this award demonstrates the level of breakthrough innovation we've achieve with the MDO4000," said Roy Siegel, general manager, Oscilloscopes at Tektronix. "As the world embraces more and more wireless in all type of systems, we recognized that engineers needed a better tool for solving complicated design issues quickly and efficiently. With its unique ability to span time and frequency domains simultaneously, the MDO4000 is that tool."

Introduced on August 30, 2011, the MDO4000 Series is tailored to meet the needs of the more than 60 percent of oscilloscope users who also use a spectrum analyzer to troubleshoot embedded designs with wireless functionality. As the first oscilloscope ever to integrate the functionality of a spectrum analyzer, the MDO4000 provides a powerful toolset which can save days or even weeks of debug time.

With the MDO4000, engineers can replace both a scope and spectrum analyzer with a single instrument. This enables them to continue using their tool of choice, the oscilloscope, to look at the frequency domain rather than having to find and relearn a spectrum analyzer. For debugging, it goes well beyond typical spectrum analyzer functionality by allowing users to capture time-correlated analog, digital and RF signals across 4 analog, 16 digital and 1 RF channel. With separate instruments, it is virtually impossible to accurately correlate signals across domains. This enables a new realm of testing, simplifying common debug tasks for today's integrated wireless-enabled designs. For instance, now engineers can easily measure how long it takes their RF power amplifier to turn-on after a command is sent on the device's serial bus.

"It was a challenge for our judges to select one winner in each category from all of the creative and innovative technologies represented by the finalists," said Junko Yoshida, Editor in Chief, EE Times, UBM Electronics. "The winners have proven that they are pioneers in developing and implementing breakthroughs in electronics. We hope this awards program gives companies worldwide the impetus to stretch their imaginations and their resources for even more progress in the coming year."


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