Anritsu ME7834A/L Mobile Device Test Platform Garners LTE Americas Award for Best Network/Device Testing Product

Anritsu Company, a worldwide leader in LTE test solutions, announces that its ME7834A/L Mobile Device Test Platform has been named the winner of the Best Network/Device Testing Products for LTE category, announced as part of the LTE North America Awards Dinner held in Dallas. By earning the award, Anritsu strengthens its position as a leader in LTE test solutions, and the ME7834A/L is recognized as an innovative product that is helping in the successful roll out and implementation of LTE technology worldwide.

"The LTE Awards recognize the best in LTE technology. Earning an LTE Award signifies that Anritsu is committed to providing innovative test solutions and establishing itself as a leader in LTE," said Wade Hulon, Vice President and General Manager, Anritsu Americas. "The award is especially significant because it was given after extensive review by a panel of industry experts who recognized that the ME7834A/L meets the needs of chipset companies, device manufacturers, carriers, test houses, and other parts of the wireless device ecosystem in a manner unlike any other test solution on the market."

Independently judged by an operator-led panel, the LTE North America Awards are a celebration of growth and success across the globe. The ME7834A/L was selected by the panel after extensive evaluation of countless entries in the Best Network/Device Testing category.

The ME7834A/L is a scalable system for protocol conformance and carrier acceptance testing of 2G, 3G, and 4G/LTE wireless technologies. Wireless device OEMs, carriers, test houses, and other elements of the device ecosystem are able to use this system to quickly and easily determine a device's conformance to 3GPP and carrier-specific standards.

Integrated "best-in-class" signaling testers for LTE, UTRAN/GERAN, and CDMA2000 technologies allow the ME7834A/L to offer excellent platform flexibility, including simulation of inter-RAT handovers, complex cell selection environments, high-speed throughput, and mobility with fading. Additionally, the choice of test case programming and execution environments, including the graphical Rapid Test Designer (RTD) software, and TTCN3-based Protocol Conformance Test (PCT) software, allow the ME7834A/L to easily adapt to end-user requirements.

In October, Anritsu achieved the #1 position for protocol conformance test with the ME7834L in bands 1, 4, 5, 13, and 20, providing an even higher level of value for members of the LTE device ecosystem that choose to use this flexible platform.

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