Keithley Seminar Offers Tips For On-Wafer Probing

Keithley Instruments will broadcast a free, web-based seminar entitled 'Tips, Tricks and Traps for On-Wafer Probing' on Thursday 28 January 2010. This one-hour seminar will demonstrate the best practices for on-wafer probing and how to identify and solve common problems.

Those who attend this seminar will learn: how to cable for accurate low-current DC measurements, accurate CV measurements and ultra-fast and pulsed IV measurements; the benefits of using Keithley-supplied cables and accessories to perform DC, CV and ultra-fast and pulsed IV measurements; proper grounding and guarding techniques; selecting the proper types of interconnect cables; and how to troubleshoot interconnect problems.

The event will conclude with a text-based question-and-answer session. The Tips, Tricks and Traps for On-Wafer Probing seminar is recommended for test engineers and test engineering managers with a basic understanding of wafer probing. The content is appropriate for engineers working with on-wafer devices. To register for this event, which will be broadcast at 15:00 CET for the European audience, visit http://www.keithley.info/probingtips.

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