Keithley Adds Data-Visualisation To Series 3700

Keithley Instruments has added a web-browser based multi-channel graphing toolkit capability to its Series 3700 System Switch/Multimeter range. This new data-visualisation capability, which is included at no charge in the firmware for all new Series 3700 mainframes, offers users a quick and easy way to observe measurement data against time. The optional built-in digital multimeter allows this data to be measured while channel measurements are made, without the need for programming or data file manipulation.

This early-look capability makes it easy for users to quickly gauge the progress of long-duration tests and to take quick corrective action if measurement results are not as anticipated. Series 3700 mainframes support high-speed multi-channel measurements. The addition of the graphing toolkit capability allows users to observe the data acquired either in numerical form or in graphical form on their choice of up to 40 channels.

The acquired data can be viewed in either real-time mode or in user-defined increments. This simplifies comparing and contrasting readings on a per-channel basis, to allow potential problems to be identified quickly. For example, this capability would be useful in applications such as burn-in testing, which could involve monitoring multiple temperature, voltage and resistance measurements, then looking for trends in the measurements over the course of the test.

Engineers involved in characterising devices in research and development applications should find this new graphing toolkit capability particularly helpful. It eliminates the time consuming and confusing process of pulling data from reading buffers and analysing it with an external package.

In this way, the new capability speeds and simplifies mainframe and test-system set-up time, channel and signal interaction and remote channel monitoring against time applications. This new capability leverages the Series 3700's compatibility with the LAN Extensions for Instrumentation (LXI) standard by expanding upon the built-in instrument-control web page included on many LXI instruments. There is no need to install new software on a PC or on the Series 3700 mainframe - the capability is included in the mainframe's firmware and can be accessed via any standard web-browser.

The toolkit builds upon the web-based instrument controls already included in Series 3700 mainframes for controlling and monitoring the switching cards installed in the mainframe and the optional built-in digital multimeter. The graphical user interface also provides access to a special version of Keithley's Test Script Builder application for writing test scripts to create unique testing functions. Series 3700 mainframes offer scalable, high-performance switching and multi-channel measurements that are optimised for automated testing of electronic products and components.

Keithley's next-generation Series 3700 System Switch/DMM satisfies the demands of medium to high channel-count applications with its ability to control up to 576 multiplexer channels in a six-slot, 2U form factor, saving precious rack space and lowering the cost of test. A high-performance integrated DMM option, the Model 3706, provides fast, low-noise, enhanced sensitivity measurements with resolutions up to 71/2 digits and speeds to 15,000rdgs/sec at a price lower than typical 61/2-digit DMMs.

Series 3700 System Switch/Multimeter instruments include a variety of capabilities optimised for high-speed testing, including LXI Class B compliance with IEEE 1588 time synchronisation. Other capabilities that enhance testing speed include Keithley's embedded Test Script Processor (TSP) technology, which brings PC-like functionality into the instrument, and TSP-Link, a master/slave communication bus that simplifies system expansion. TSP-Link provides for seamless integration with Series 2600A System Sourcemeter instruments, for adding high-speed I-V source and measurement capabilities.

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