Amplicon Customises Test-System Hardware
Amplicon's Test Systems Division provides system integrators and end-users with the widest range of test-system hardware at a competitive price. PXI, compact PCI (cPCI), LXI and PC-based systems, along with an extensive product-integration service, provide customers with a finished hardware platform that allows them to concentrate on their specific area of expertise - typically the addition of a bespoke test software application.
John Hayward, product manager for Amplicon's Test Systems Division, said: 'In a recent application, Amplicon's PC-based test system provided a saving of over GBP100,000 compared with in-house development, at a major oil and gas instrumentation specialist.' In the current trend of out-sourcing non-critical functions, many companies have reduced knowledge and manpower for implementing new test systems and upgrading existing lines.
Factors that must be considered when designing a suitable test-system solution include: power calculations for PC power supply and UPS specifications; selection of appropriate signal conditioning for connection to the myriad sensors and transducers in the market; data-transfer limitations of system buses such as PCI and VXI; and advanced triggering and synchronisation for time-dependent measurements.
John Hayward, product manager for Amplicon's Test Systems Division, said: 'In a recent application, Amplicon's PC-based test system provided a saving of over GBP100,000 compared with in-house development, at a major oil and gas instrumentation specialist.' In the current trend of out-sourcing non-critical functions, many companies have reduced knowledge and manpower for implementing new test systems and upgrading existing lines.
Factors that must be considered when designing a suitable test-system solution include: power calculations for PC power supply and UPS specifications; selection of appropriate signal conditioning for connection to the myriad sensors and transducers in the market; data-transfer limitations of system buses such as PCI and VXI; and advanced triggering and synchronisation for time-dependent measurements.
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