Keithley Considers Ultra-Fast I-V Applications
Keithley Instruments has created an interactive applications overview, entitled 'Ultra-Fast I-V Applications'. The overview provides instruction and insight into a variety of semiconductor measurement applications that require ultra-fast I-V measurements, and it can be viewed online at the company's website. Ultra-fast I-V sourcing and measurement have become increasingly important capabilities for many semiconductor technologies. Using pulsed I-V signals to characterise devices rather than DC signals makes it possible to study or eliminate the effects of self-heating (joule heating) or to minimise current drifting in measurements due to trapped charge. The applications overview includes sections on integrated high-speed sourcing and measurement; a discussion of voltage, current, and timing parameter ranges; a description of the built-in interactive software provided in Keithley's ultra-fast I-V test solution; and a detailed discussion of ultra-fast I-V applications. B...